Wide Bandgap Materials for Semiconductor Devices

Kuan Wei Lee, Chuan Hsi Liu, Durga Misra

研究成果: 雜誌貢獻 › 編者言 › 同行評審

1 引文斯高帕斯（Scopus）

原文	英語
頁（從 - 到）	306
頁數	1
期刊	Microelectronics Reliability
卷	91
DOIs	https://doi.org/10.1016/j.microrel.2018.10.010
出版狀態	已發佈 - 2018 12月

ASJC Scopus subject areas

@article{aff376a9d615483595f52ef9438474ef,

title = "Wide Bandgap Materials for Semiconductor Devices",

author = "Lee, {Kuan Wei} and Liu, {Chuan Hsi} and Durga Misra",

year = "2018",

month = dec,

doi = "10.1016/j.microrel.2018.10.010",

language = "English",

volume = "91",

pages = "306",

journal = "Microelectronics Reliability",

issn = "0026-2714",

publisher = "Elsevier Limited",

}

TY - JOUR

T1 - Wide Bandgap Materials for Semiconductor Devices

AU - Lee, Kuan Wei

AU - Liu, Chuan Hsi

AU - Misra, Durga

PY - 2018/12

Y1 - 2018/12

UR - http://www.scopus.com/inward/record.url?scp=85056880398&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=85056880398&partnerID=8YFLogxK

U2 - 10.1016/j.microrel.2018.10.010

DO - 10.1016/j.microrel.2018.10.010

M3 - Editorial

AN - SCOPUS:85056880398

SN - 0026-2714

VL - 91

SP - 306

JO - Microelectronics Reliability

JF - Microelectronics Reliability

ER -