What makes teacher students become official teachers - A preliminary exploration of critical predictors based on data mining techniques

Yi Fen Yeh, Jia Li Huang, Ying Shao Hsu, Yuen Hsien Tseng

研究成果: 書貢獻/報告類型會議貢獻

摘要

This study tries to help answer some questions encountered by the decision makers of teacher training program: which factors are more critical to lead the teacher students to success, i, e, to become official teachers. A total of 2010 student records were collected and thousands of courses taken by the students are categorized into six knowledge types. A decision tree learned from these data with 23 attributes was able to inform which learning paths would lead to better chance of success.

原文英語
主出版物標題Proceedings - 2016 5th IIAI International Congress on Advanced Applied Informatics, IIAI-AAI 2016
編輯Ayako Hiramatsu, Tokuro Matsuo, Akimitsu Kanzaki, Norihisa Komoda
發行者Institute of Electrical and Electronics Engineers Inc.
頁面1176-1177
頁數2
ISBN(電子)9781467389853
DOIs
出版狀態已發佈 - 2016 八月 31
事件5th IIAI International Congress on Advanced Applied Informatics, IIAI-AAI 2016 - Kumamoto, 日本
持續時間: 2016 七月 102016 七月 14

出版系列

名字Proceedings - 2016 5th IIAI International Congress on Advanced Applied Informatics, IIAI-AAI 2016

其他

其他5th IIAI International Congress on Advanced Applied Informatics, IIAI-AAI 2016
國家日本
城市Kumamoto
期間16/7/1016/7/14

ASJC Scopus subject areas

  • Information Systems
  • Computer Networks and Communications
  • Computer Science Applications
  • Computer Vision and Pattern Recognition

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  • 引用此

    Yeh, Y. F., Huang, J. L., Hsu, Y. S., & Tseng, Y. H. (2016). What makes teacher students become official teachers - A preliminary exploration of critical predictors based on data mining techniques. 於 A. Hiramatsu, T. Matsuo, A. Kanzaki, & N. Komoda (編輯), Proceedings - 2016 5th IIAI International Congress on Advanced Applied Informatics, IIAI-AAI 2016 (頁 1176-1177). [7557793] (Proceedings - 2016 5th IIAI International Congress on Advanced Applied Informatics, IIAI-AAI 2016). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/IIAI-AAI.2016.254