摘要
Reliable multilevel resistive switching in nanoscale cells is desirable for the wide adoption of resistive random access memory as the next-generation nonvolatile memory. We designed NiO-based cells in arrays of multilayered NiO/Pt nanowires to explore multilevel memory effects. Nonpolar resistive switching reproducibly occurs with significantly reduced switching voltages, narrow switching voltage distributions and a robust multilevel memory effect. A high resistance ratio (∼105) between the highand low-resistance states in nanoscale cells enables stable multilevels that can be induced easily by a series of pulsed voltage. The existence of intermediate resistance states in NiO/Pt nanowire arrays can be well explained by the binary-resistor model combined with energy perturbations induced by the pulse voltage. We also verified that the conduction mechanism in multilayered NiO/Pt nanowires is dominated by the hopping of holes. Our bottom-up approach and proposed mechanism explain the controllable multilevel memory effect and facilitate sound device design to encourage their universal adoption.
| 原文 | 英語 |
|---|---|
| 文章編號 | 81 |
| 期刊 | NPG Asia Materials |
| 卷 | 6 |
| 發行號 | 2 |
| DOIs | |
| 出版狀態 | 已發佈 - 2014 2月 |
| 對外發佈 | 是 |
ASJC Scopus subject areas
- 建模與模擬
- 一般材料科學
- 凝聚態物理學
指紋
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