摘要
Epitaxial CrO2 (110)-oriented films were fabricated on Si (100) substrates buffered by rutile TiO2 derived from oxidation of a pulsed-laser-deposited TiN layer. The epitaxial films of CrO2 were prepared by chemical vapor deposition in a two-zone furnace with oxygen flow from a CrO3 precursor. The transport measurements show that the CrO2 films are metallic with a Curie temperature of about 380 K. The temperature dependence of resistivity was best described by a phenomenological expression ρ(T)=ρ0+AT2e(-Δ/T) over the range of 5-350 K with Δ=94K. The magnetic measurements show the in-plane coercive fields are about 30 and 60 Oe at 300 and 5 K, respectively. The temperature dependent spontaneous magnetization follows Bloch's T 3/2 law and the slope suggests a critical wavelength of λΔ∼30.6Å beyond which spin-flip scattering becomes important.
原文 | 英語 |
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頁(從 - 到) | 4202-4204 |
頁數 | 3 |
期刊 | Applied Physics Letters |
卷 | 80 |
發行號 | 22 |
DOIs | |
出版狀態 | 已發佈 - 2002 6月 3 |
對外發佈 | 是 |
ASJC Scopus subject areas
- 物理與天文學(雜項)