Thermoelectric characteristics of annealed N-type BiTe thin film

H. H. Hsu, C. H. Cheng, P. C. Chen, C. H. Yeh, Y. R. Chen, Y. W. Chou, Y. L. Lin, C. C. Yang

研究成果: 書貢獻/報告類型會議貢獻

摘要

The thermoelectric n-type Bi-Te based thin films with and without oxygen annealing were investigated and the related thermoelectric properties were well defined and characterized in this study. We found that the Seebeck coefficient, electrical resistivity and power factor for thin-film BiTe were potentially comparable with those of bulk materials if an appropriate annealed treatment could be realized. In addition, the formation of TeO with higher resistivity in thin-film BiTe might bring out the contribution on the enhanced Seebeck coefficient, which showed the potential to the application of thin-film thermoelectric device.

原文英語
主出版物標題Solid State Topics (General) - 220th ECS Meeting
頁面27-36
頁數10
版本34
DOIs
出版狀態已發佈 - 2012 十二月 1
事件Solid State Topics General Session - 220th ECS Meeting - Boston, MA, 美国
持續時間: 2011 十月 92011 十月 14

出版系列

名字ECS Transactions
號碼34
41
ISSN(列印)1938-5862
ISSN(電子)1938-6737

其他

其他Solid State Topics General Session - 220th ECS Meeting
國家美国
城市Boston, MA
期間11/10/911/10/14

ASJC Scopus subject areas

  • Engineering(all)

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  • 引用此

    Hsu, H. H., Cheng, C. H., Chen, P. C., Yeh, C. H., Chen, Y. R., Chou, Y. W., Lin, Y. L., & Yang, C. C. (2012). Thermoelectric characteristics of annealed N-type BiTe thin film. 於 Solid State Topics (General) - 220th ECS Meeting (34 編輯, 頁 27-36). (ECS Transactions; 卷 41, 編號 34). https://doi.org/10.1149/1.3697459