The understanding of gate capacitance matching on achieving a high performance NC MOSFET with sufficient mobility

C. K. Chiang, P. Husan, Y. C. Lou, F. L. Li, E. R. Hsieh, C. H. Liu, Steve S. Chung

研究成果: 書貢獻/報告類型 › 會議論文篇章

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Engineering & Materials Science

Chemical Compounds