摘要
Energy-filtered transmission electron microscopy (EFTEM) was used to examine the distribution of silicon as T-atoms in mesoporous MCM-41 molecular sieves. At nanometer-sized resolution, the Si distribution image derived from electron energy loss spectroscopy (EELS) with Gatan imaging filter (GIF) was found to be ordered and correlated well to the hexagonal array of the one-dimensional channels of MCM-41. In addition, the pore-to-pore distance and the wall thickness of MCM-41 (determined by Si distribution map) are in good agreement with those derived from X-ray diffraction and N2 adsorption methods.
原文 | 英語 |
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頁(從 - 到) | 287-295 |
頁數 | 9 |
期刊 | Microporous and Mesoporous Materials |
卷 | 27 |
發行號 | 2-3 |
DOIs | |
出版狀態 | 已發佈 - 1999 2月 |
對外發佈 | 是 |
ASJC Scopus subject areas
- 化學 (全部)
- 材料科學(全部)
- 凝聚態物理學
- 材料力學