The single particle tracking system

Ai Tang Chang*, Yi Ren Chang, Sien Chi, Long Hsu

*此作品的通信作者

研究成果: 書貢獻/報告類型會議論文篇章

摘要

In an optical tweezers system, the force measurement with a resolution less than pico-Newton can be achieved by precise measurement and analysis of the trapped particle trajectory. Typically, this single particle tracking technique is realized by a quadrant position sensor which detects the scattering lights of the trapping laser beam from the trapped particle. However, as the radius of the trapped particle is larger than the wavelength of the trapped laser, the scattering pattern becomes complicated, and it limits the tracking region and the signal sensitivity on the trapped particle. To solve this issue, an extra probing laser with optimized focal offset according to the trapping laser is applied to improve the flexibility and performance of our particle tracking system for each particle size. A rule of thumb between the optimized focal offsets and particle size is also concluded from the experimental results and theoretical simulations.

原文英語
主出版物標題Optical Trapping and Optical Micromanipulation VII
DOIs
出版狀態已發佈 - 2010
事件Optical Trapping and Optical Micromanipulation VII - San Diego, CA, 美国
持續時間: 2010 八月 12010 八月 5

出版系列

名字Proceedings of SPIE - The International Society for Optical Engineering
7762
ISSN(列印)0277-786X

其他

其他Optical Trapping and Optical Micromanipulation VII
國家/地區美国
城市San Diego, CA
期間2010/08/012010/08/05

ASJC Scopus subject areas

  • 電子、光磁材料
  • 凝聚態物理學
  • 電腦科學應用
  • 應用數學
  • 電氣與電子工程

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