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The Magnetic Reversal Study of Permalloy Microdomains

  • Y. W. Huang*
  • , C. K. Lo
  • , Y. D. Yao
  • , Jau Jiu Ju
  • , Tzuan Ren Jeng
  • , J. H. Huang
  • *此作品的通信作者

研究成果: 雜誌貢獻期刊論文同行評審

1   連結會在新分頁中開啟 引文 斯高帕斯(Scopus)

摘要

For studying the influence of the current passed through a metal line for the magnetic cells on semiconductors, we prepared two types of the devices. Case 1 is that only one patterned permalloy cell on top of the insulated metal strip, and two cells are beside the strip. Case 2 is that all three patterned magnetic cells are on top of the strip. The magnetic field needed to reverse the magnetization of a submicrometer-size permalloy single domain cell with aspect ratio of 6 is larger than that of a unpatterned millimeter-size permalloy thin film due to the dimension effect. Magnetic force microscopy images of the patterned cells before and after applying various electrical currents were investigated. We have observed that: 1) the magnetic field produced by the word line will not change the magnetic configuration of the magnetic cells near the wires; 2) the magnetic field produced by the word line is quite uniform; and 3) for small aspect ratio of the submicrometer magnetic cells (<6), the magnetic configuration becomes multidomain, and higher magnetic field needed to reverse its magnetic state. Finally, we have shown a method that integrates an electric wire on semiconductors for generation of surrounding magnetic fields and patterned magnetic cells on micrometer length scales.

原文英語
頁(從 - 到)3444-3446
頁數3
期刊IEEE Transactions on Magnetics
39
發行號5 II
DOIs
出版狀態已發佈 - 2003 9月
對外發佈

ASJC Scopus subject areas

  • 電子、光磁材料
  • 電氣與電子工程

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