The Compton profiles of vanadium oxides

Chu Nan Chang*, Chuhn Chuh Chen, Huey Fen Liu

*此作品的通信作者

研究成果: 雜誌貢獻期刊論文同行評審

4 引文 斯高帕斯(Scopus)

摘要

The isotropic Compton profiles of vanadium oxides VO, V2O 3, VO2, V6O13 and V 2O5 were measured by using 59.54 keV gamma -rays. The Compton profiles calculated by using the molecular-cluster model were found to be improper in describing the experimental results of VO and VO2. The molecular-cluster model seems to underestimate the metal-ligand covalency. The localization and delocalization of valence electrons when forming oxides will be discussed on the basis of the atomic superposition model.

原文英語
文章編號032
頁(從 - 到)10445-10452
頁數8
期刊Journal of Physics: Condensed Matter
4
發行號50
DOIs
出版狀態已發佈 - 1992

ASJC Scopus subject areas

  • 材料科學(全部)
  • 凝聚態物理學

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