The analysis of channel stress induced by CESL in N-MOSFET

Ming-Jenq Twu, Wen-Chung Kao, K. C. Lin, K. D. Chen, Y. T. Kua, Chuan-Hsi Liu

研究成果: 書貢獻/報告類型會議論文篇章

指紋 深入研究「The analysis of channel stress induced by CESL in N-MOSFET」主題。共同形成了獨特的指紋。

Engineering & Materials Science