摘要
High structural susceptibility of multiferroic BiFeO3 (BFO) makes it a potential replacement of current Pb-based piezoelectrics. In this study, a tetragonal phase is identified based on a combination of x-ray diffraction, scanning transmission electronic microscopy, x-ray absorption spectroscopy, and Raman spectroscopy when BFO is grown on yttria-stabilized zirconia (YSZ) substrates. To distinguish the discrepancy between this tetragonal phase and common cases of monoclinic BFO, piezoelectric force microscopy images and optical property are also performed. It shows a lower electrostatic energy of ferroelectric domains and a large reduction of band gap for BFO grown on YSZ substrate comparing to the well-known one grown on LaAlO3 substrate. Our findings in this work can provide more insights to understand the structural diversity of multiferroic BFO system for further applications.
| 原文 | 英語 |
|---|---|
| 文章編號 | 116104 |
| 期刊 | APL Materials |
| 卷 | 3 |
| 發行號 | 11 |
| DOIs | |
| 出版狀態 | 已發佈 - 2015 11月 1 |
ASJC Scopus subject areas
- 一般材料科學
- 一般工程
指紋
深入研究「Tetragonal BiFeO3 on yttria-stabilized zirconia」主題。共同形成了獨特的指紋。引用此
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