Test structures of LASCR device for RF ESD protection in nanoscale CMOS process

Chun-Yu Lin, Rong Kun Chang

研究成果: 書貢獻/報告類型會議論文篇章

1 引文 斯高帕斯(Scopus)

摘要

The test structures of inductor-assisted silicon-controlled rectifier (LASCR) are investigated in this work to protect the radio-frequency (RF) integrated circuits from electrostatic discharge (ESD) damages. Verified in silicon chip, the LASCR with the assistance of inductor can provide both good ESD robustness and RF performances. With the better performances, the LASCR is very suitable for gigahertz RF applications.

原文英語
主出版物標題2016 29th IEEE International Conference on Microelectronic Test Structures, ICMTS 2016 - Conference Proceedings
發行者Institute of Electrical and Electronics Engineers Inc.
頁面100-103
頁數4
ISBN(電子)9781467387934
DOIs
出版狀態已發佈 - 2016 五月 20
事件29th IEEE International Conference on Microelectronic Test Structures, ICMTS 2016 - Yokohama, 日本
持續時間: 2016 三月 282016 三月 31

出版系列

名字IEEE International Conference on Microelectronic Test Structures
2016-May

其他

其他29th IEEE International Conference on Microelectronic Test Structures, ICMTS 2016
國家日本
城市Yokohama
期間2016/03/282016/03/31

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

指紋 深入研究「Test structures of LASCR device for RF ESD protection in nanoscale CMOS process」主題。共同形成了獨特的指紋。

引用此