A terahertz (THz) dielectric property characterization method based on a unified single oscillator model has been developed and applied to a variety of multi-component silicate oxide glasses. The experimental values of dielectric constant determined by THz time-domain spectroscopy (TDS) in the sub-THz region have been confirmed to agree well with the values calculated by the single oscillator model which incorporates the local field effects and the material’s ionicity. This has provided a unified formulation that enables systematic determination of the key physical parameters solely from the high-frequency (optical) and low-frequency (sub-THz) dielectric constants and characteristic resonance frequency in the (sub-)THz region. The low-frequency dielectric constant has been demonstrated to be fully determined by a single parameter of the microscopic total susceptibility. Also, the polarization ionicity, which is defined by the ionic fraction in the microscopic total susceptibility, has been found to be a good indicator to represent the ionic nature of the material. Through this analysis, an increasing trend of the effective ionic charge has been found in high-dielectric constant glasses such as oxyfluorosilicate glasses, and the physical mechanism of their dielectric constant enhancement has been discussed. The present method is expected to be applied to design and characterize dielectric properties of a wide range of multi-component glasses and other isotropic, insulating materials.
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