Surface modification of YBa2Cu3Oy thin films with a scanning tunneling microscope

Sufen Chen, L. M. Wang, W. B. Jian, S. Y. Wang, H. C. Yang, H. E. Horng

研究成果: 雜誌貢獻文章

3 引文 (Scopus)

摘要

We report a systematic modification of thin YBa2Cu 3Oy films with a scanning tunneling microscope. The samples include YBa2Cu3Oy films on MgO(001) and YBa2Cu3Oy/PrBa2Cu3O y bilayer films on SrTiO3 (001). The bias voltage of the tip was kept negative and varied from -600 to -1200 mV. The tip was operated in a constant tunneling current mode with tunneling current 0.3-0.7 nA and scanning rate 1 Hz. Modification of the surface begins with nucleation of holes, or at the edge of a dislocation or protrusion on the surface, and is achieved by successively scanning a fixed area. We show the image obtained from an atomic force microscope which can help us look into the mechanism of the modification.

原文英語
頁(從 - 到)2535-2537
頁數3
期刊Journal of Applied Physics
76
發行號4
DOIs
出版狀態已發佈 - 1994 十二月 1

指紋

microscopes
scanning
thin films
nucleation
electric potential

ASJC Scopus subject areas

  • Physics and Astronomy(all)

引用此文

Surface modification of YBa2Cu3Oy thin films with a scanning tunneling microscope. / Chen, Sufen; Wang, L. M.; Jian, W. B.; Wang, S. Y.; Yang, H. C.; Horng, H. E.

於: Journal of Applied Physics, 卷 76, 編號 4, 01.12.1994, p. 2535-2537.

研究成果: 雜誌貢獻文章

Chen, Sufen ; Wang, L. M. ; Jian, W. B. ; Wang, S. Y. ; Yang, H. C. ; Horng, H. E. / Surface modification of YBa2Cu3Oy thin films with a scanning tunneling microscope. 於: Journal of Applied Physics. 1994 ; 卷 76, 編號 4. 頁 2535-2537.
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