TY - GEN
T1 - Study of RC-Diode ESD Protection Circuit for High-Frequency Applications
AU - Lin, Chun Yu
AU - Li, Bo Yan
AU - Fu, Yi Quan
N1 - Funding Information:
This work was supported by the Ministry of Science and Technology (MOST), Taiwan, under Contract of MOST 110-2221-E-003-025-MY3. The authors would like to thank the Taiwan Semiconductor Research Institute (TSRI) for the support of chip fabrication and measurement.
Publisher Copyright:
© 2022 EOS/ESD Association, Inc.
PY - 2022
Y1 - 2022
N2 - The RC-diode ESD protection circuit has been presented to offer the ESD protection in high-frequency integrated circuits. The protection circuit combines the ESD protection diodes with the embedded silicon-controlled rectifier (SCR) and the inserting resistors to provide the appropriate performances including ESD-current-handling ability, signal loss, and layout area. This work provides the thoroughly study of RC-diode ESD protection circuit in CMOS silicon chip.
AB - The RC-diode ESD protection circuit has been presented to offer the ESD protection in high-frequency integrated circuits. The protection circuit combines the ESD protection diodes with the embedded silicon-controlled rectifier (SCR) and the inserting resistors to provide the appropriate performances including ESD-current-handling ability, signal loss, and layout area. This work provides the thoroughly study of RC-diode ESD protection circuit in CMOS silicon chip.
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M3 - Conference contribution
AN - SCOPUS:85144627785
T3 - International EOS/ESD Symposium on Design and System, IEDS 2022
BT - International EOS/ESD Symposium on Design and System, IEDS 2022
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 2nd Annual International EOS/ESD Symposium on Design and System, IEDS 2022
Y2 - 9 November 2022 through 11 November 2022
ER -