Study of optical transmittance of AgO_x nano thin film in super-resolution near-field structure

The AgO_x-type super-resolution near-field structure (super-RENS) is one of the nano thin films that can give a nonlinear optical effect similar to that of the optical probe of the scanning near-field optical microscope. Structural variations of different thicknesses of the AgO_x thin film are observed and studied using a field-emission scanning electron microscope (FE-SEM). For single AgO_x nano thin film, the critical temperature and threshold of the evaporation temperature are 154° and 600°, respectively. Results show that the sandwiched AgO_x nano thin film has a higher critical temperature, that is, about 280°. For the sandwiched AgO_x nano thin film, the transmittance peak is dependent on the thickness of the AgO_x thin film. The interesting properties of the AgO_x nano thin film of the super-resolution structure indicate a great potential for photonic applications.