摘要
Textured and epitaxial {001} NiFe/NiMn/Co films were grown on Cu/Si (100) structural templates by using e-beam evaporation. Numerical analysis of high-resolution TEM images was used to determine the local d-spacing of NiMn. The local c/a ratio for the annealed sample varied across the film. The well-aligned orientation relationship between NiFe and NiMn stabilized the disordered NiMn phase, which resulted in a small exchange field. Interdiffusion was observed by energy dispersive X-ray spectroscopy near the interfaces of Cu/NiFe, NiFe/NiMn, and NiMn/Co. Interdiffusion may modify the interfacial structures, and may contribute to the enhancement of the coercivity in NiFe and Co.
原文 | 英語 |
---|---|
頁(從 - 到) | 2641-2643 |
頁數 | 3 |
期刊 | IEEE Transactions on Magnetics |
卷 | 36 |
發行號 | 5 I |
DOIs | |
出版狀態 | 已發佈 - 2000 9月 |
對外發佈 | 是 |
事件 | 2000 International Magnetics Conference (INTERMAG 2000) - Toronto, Ont, 加拿大 持續時間: 2000 4月 9 → 2000 4月 12 |
ASJC Scopus subject areas
- 電子、光磁材料
- 電氣與電子工程