Strained pMOSFETs with SiGe channel and embedded SiGe source/drain stressor under heating and hot-carrier stresses

Mu Chun Wang, Min Ru Peng, Liang Ru Ji, Heng Sheng Huang, Shuang Yuan Chen, Shea Jue Wang, Hong Wen Hsu, Wen Shiang Liao, Chuan-Hsi Liu

研究成果: 會議貢獻類型同行評審

1 引文 斯高帕斯(Scopus)

指紋 深入研究「Strained pMOSFETs with SiGe channel and embedded SiGe source/drain stressor under heating and hot-carrier stresses」主題。共同形成了獨特的指紋。

Engineering & Materials Science