Stacking fault induced tunnel barrier in platelet graphite nanofiber

Yann Wen Lan*, Wen Hao Chang, Yuan Yao Li, Yuan Chih Chang, Chia Seng Chang, Chii Dong Chen

*此作品的通信作者

研究成果: 雜誌貢獻期刊論文同行評審

3 引文 斯高帕斯(Scopus)

摘要

A correlation study using image inspection and electrical characterization of platelet graphite nanofiber devices is conducted. Close transmission electron microscopy and diffraction pattern inspection reveal layers with inflection angles appearing in otherwise perfectly stacked graphene platelets, separating nanofibers into two domains. Electrical measurement gives a stability diagram consisting of alternating small-large Coulomb blockade diamonds, suggesting that there are two charging islands coupled together through a tunnel junction. Based on these two findings, we propose that a stacking fault can behave as a tunnel barrier for conducting electrons and is responsible for the observed double-island single electron transistor characteristics.

原文英語
文章編號103505
期刊Applied Physics Letters
105
發行號10
DOIs
出版狀態已發佈 - 2014 九月 8
對外發佈

ASJC Scopus subject areas

  • 物理與天文學(雜項)

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