Two Fe/Gd/Fe/Gd multilayers with different layer thicknesses were grown on Si (100) by magnetron sputtering. The as-deposited samples were vacuum-annealed at 100 °C, 200 °C, and 300 °C. They were studied by grazing incidence x-ray diffraction (XRD), secondary ion mass spectroscopy (SIMS), vibrating sample magnetometer (VSM) and magneto-optical Kerr effect (MOKE). The deposition rates for Fe and for Gd are (1-2) and 4 angstroms s-1, respectively. The XRD and SIMS data show that interdiffusion occurs between Fe and Gd layers, and between Gd and Si layers. The thicker multilayers show strong in-plane uniaxial anisotropy.
|頁（從 - 到）||65-70|
|期刊||Materials Research Society Symposium - Proceedings|
|出版狀態||已發佈 - 1996 十二月 1|
|事件||Proceedings of the 1996 MRS Spring Symposium - San Francisco, CA, USA|
持續時間: 1996 四月 8 → 1996 四月 12
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