SIMS and MOKE studies of Fe/Gd multilayers on Si

Li Shing Hsu*, C. K. Lo, Y. D. Yao, C. S. Yang


研究成果: 雜誌貢獻會議論文同行評審

1 引文 斯高帕斯(Scopus)


Two Fe/Gd/Fe/Gd multilayers with different layer thicknesses were grown on Si (100) by magnetron sputtering. The as-deposited samples were vacuum-annealed at 100 °C, 200 °C, and 300 °C. They were studied by grazing incidence x-ray diffraction (XRD), secondary ion mass spectroscopy (SIMS), vibrating sample magnetometer (VSM) and magneto-optical Kerr effect (MOKE). The deposition rates for Fe and for Gd are (1-2) and 4 angstroms s-1, respectively. The XRD and SIMS data show that interdiffusion occurs between Fe and Gd layers, and between Gd and Si layers. The thicker multilayers show strong in-plane uniaxial anisotropy.

頁(從 - 到)65-70
期刊Materials Research Society Symposium - Proceedings
出版狀態已發佈 - 1996
事件Proceedings of the 1996 MRS Spring Symposium - San Francisco, CA, USA
持續時間: 1996 4月 81996 4月 12

ASJC Scopus subject areas

  • 一般材料科學
  • 凝聚態物理學
  • 材料力學
  • 機械工業


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