摘要
Integration of high performance n-type and p-type field-effect transistors with complementary device operation in the same kind of layered materials is highly desirable for pursuing low power and flexible next-generation electronics. In this work, we have shown a well-mannered growth of MoS2 on a fin-shaped oxide structure and integration of both n-type and p-type MoS2 by using a traditional implantation technique. With the advance of the fin-shaped structure, the maxima and the effective ON current density for the MoS2 fin-shaped field-effect transistors are respectively obtained to be about 50 μA μm-1 (normalized by the circumference of the fin) and around 500 μA μm-1 (only normalized by the fin size), while its ON/OFF ratio is more than 106 with low OFF current of a few pA. Based on our n-type and p-type MoS2 fin-shaped field-effect transistors, the complementary MoS2 inverter with a high DC voltage gain of more than 20 is acquired. Our results provide evidence for complementary 2D material operation in the same materials, a promising avenue for the development of high performance and high-density complementary 2D electronic devices.
| 原文 | 英語 |
|---|---|
| 頁(從 - 到) | 683-688 |
| 頁數 | 6 |
| 期刊 | Nanoscale Horizons |
| 卷 | 4 |
| 發行號 | 3 |
| DOIs | |
| 出版狀態 | 已發佈 - 2019 5月 |
ASJC Scopus subject areas
- 一般材料科學
指紋
深入研究「Scalable fabrication of a complementary logic inverter based on MoS2 fin-shaped field effect transistors」主題。共同形成了獨特的指紋。引用此
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