摘要
Room-temperature ferromagnetism (RTFM) was observed in pulsed-laser deposited amorphous In-Ga-Zn-O (a-IGZO) films undoped with impurities containing unpaired d or f electrons. The presence of oxygen vacancies in the prepared a-IGZO films was verified by X-ray photoelectron spectroscopy and suggested to be responsible for the observed RTFM. The electrical and optical properties of the a-IGZO films were also investigated.
原文 | 英語 |
---|---|
頁(從 - 到) | 1473-1476 |
頁數 | 4 |
期刊 | Applied Physics A: Materials Science and Processing |
卷 | 116 |
發行號 | 3 |
DOIs | |
出版狀態 | 已發佈 - 2014 9月 |
ASJC Scopus subject areas
- 一般化學
- 一般材料科學