TY - JOUR
T1 - RFID technology innovations
T2 - The use of patent data
AU - Wu, Yen Chun Jim
AU - Yen, Tzu Chin
PY - 2007
Y1 - 2007
N2 - Study on Radio Frequency Identification (RFID) has recently gained increasing attention from both industry practitioners and academic researchers. However, despite discussions of its promising future and potential applications of RFID, to date, a surprising dearth of work has been conducted on RFID technology development from the holistic perspective. Patent analysis has long been considered to be an important method for assessing various aspects of technological change. This paper utilises rich, reliable information provided by RFID-related invention patents in the USPTO database to provide an overall picture of RFID innovations.
AB - Study on Radio Frequency Identification (RFID) has recently gained increasing attention from both industry practitioners and academic researchers. However, despite discussions of its promising future and potential applications of RFID, to date, a surprising dearth of work has been conducted on RFID technology development from the holistic perspective. Patent analysis has long been considered to be an important method for assessing various aspects of technological change. This paper utilises rich, reliable information provided by RFID-related invention patents in the USPTO database to provide an overall picture of RFID innovations.
KW - RFID patent analysis
KW - Radio frequency identification
KW - Technology innovation
UR - http://www.scopus.com/inward/record.url?scp=33846523975&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=33846523975&partnerID=8YFLogxK
U2 - 10.1504/IJMTM.2007.011404
DO - 10.1504/IJMTM.2007.011404
M3 - Article
AN - SCOPUS:33846523975
SN - 1368-2148
VL - 10
SP - 106
EP - 120
JO - International Journal of Manufacturing Technology and Management
JF - International Journal of Manufacturing Technology and Management
IS - 1
ER -
