摘要
Si 2p spectra collected from fluorinated Si(111)-7 × 7 are analyzed to determine whether chemical shifts induced by remote F atoms are discernible. Although the traditional interpretation adequately accounts for the observed chemical shifts without considering remotely induced shifts, recent experimental evidence indicates that such shifts may occur for highly electronegative adsorbates. Thus, an extended scheme is outlined that is consistent with all known data, but which includes remotely induced shifts. It is found that, although they differ quantitatively, both approaches yield the same qualitative results for fluorinated Si.
| 原文 | 英語 |
|---|---|
| 頁(從 - 到) | L283-L288 |
| 期刊 | Surface Science |
| 卷 | 355 |
| 發行號 | 1-3 |
| DOIs | |
| 出版狀態 | 已發佈 - 1996 6月 1 |
| 對外發佈 | 是 |
ASJC Scopus subject areas
- 凝聚態物理學
- 表面和介面
- 表面、塗料和薄膜
- 材料化學
指紋
深入研究「Remote inductive effects in the Si 2p spectra of halogenated silicon」主題。共同形成了獨特的指紋。引用此
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