Reliability of ambipolar switching poly-Si diodes for cross-point memory applications

M. H. Lee, C. Y. Kao, C. L. Yang, Y. S. Chen, H. Y. Lee, F. Chen, M. J. Tsai

研究成果: 書貢獻/報告類型會議論文篇章

9 引文 斯高帕斯(Scopus)

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