Reliability improvement of a-Si:H thin film transistors on plastic substrate with saturation in deep state after multiple bending cycles

M. H. Lee*, P. G. Chen, C. C. Hsu

*此作品的通信作者

研究成果: 雜誌貢獻 › 期刊論文 › 同行評審

1 引文 斯高帕斯（Scopus）

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INIS

Engineering

Material Science

Physics