摘要
A refractometric optical sensing device based on a multilayer narrowband reflection and transmission filter with an ultrathin metallic film is proposed. By changing the refractive index of the defect layer in this narrowband filter, we find that the shift in the resonance peak wavelength is a sensitive function of the small variation in the refractive index. This sensing method is more compact and easier to make than the usual one based on the photonic crystal sensor.
原文 | 英語 |
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頁(從 - 到) | 293-305 |
頁數 | 13 |
期刊 | Journal of Electromagnetic Waves and Applications |
卷 | 24 |
發行號 | 2-3 |
DOIs | |
出版狀態 | 已發佈 - 2010 1月 1 |
ASJC Scopus subject areas
- 電子、光磁材料
- 一般物理與天文學
- 電氣與電子工程