@inproceedings{7a84d435238d4aae870759503429ef36,
title = "Reading process of integrated circuit layout debugging: Evidence from eye movements",
abstract = "Finding bugs in CMOS Integrated Circuit (IC) layouts is a basic skill for IC design engineers and students alike. The reading process of finding bugs is the basis for learning and teaching in electronic engineering. In this pilot study, eye-movement data was used in analyzing the reading process and nature of five participants (N=5) finding bugs in CMOS layouts. Data analysis of eye movements was based on nine types of ROI (Region of Interest). The ANOVA analysis of eye movements was analyzed. The findings of experimental results included that there were significant differences among the number of fixations of nine types of ROIs. The findings suggest how learners could read the bugged IC layouts effectively and efficiently.",
keywords = "CMOS logic circuit, Eye movement, IC layout, Reading process",
author = "Ho, {Hong Fa}",
year = "2013",
doi = "10.4028/www.scientific.net/AMR.787.855",
language = "English",
isbn = "9783037858028",
series = "Advanced Materials Research",
pages = "855--860",
booktitle = "Advanced Materials Researches, Engineering and Manufacturing Technologies in Industry",
note = "2013 2nd International Symposium on Materials Science and Engineering Technology, ISMSET 2013 ; Conference date: 27-06-2013 Through 28-06-2013",
}