Reading process of integrated circuit layout debugging: Evidence from eye movements

Hong Fa Ho*

*此作品的通信作者

研究成果: 書貢獻/報告類型會議論文篇章

摘要

Finding bugs in CMOS Integrated Circuit (IC) layouts is a basic skill for IC design engineers and students alike. The reading process of finding bugs is the basis for learning and teaching in electronic engineering. In this pilot study, eye-movement data was used in analyzing the reading process and nature of five participants (N=5) finding bugs in CMOS layouts. Data analysis of eye movements was based on nine types of ROI (Region of Interest). The ANOVA analysis of eye movements was analyzed. The findings of experimental results included that there were significant differences among the number of fixations of nine types of ROIs. The findings suggest how learners could read the bugged IC layouts effectively and efficiently.

原文英語
主出版物標題Advanced Materials Researches, Engineering and Manufacturing Technologies in Industry
頁面855-860
頁數6
DOIs
出版狀態已發佈 - 2013
事件2013 2nd International Symposium on Materials Science and Engineering Technology, ISMSET 2013 - Guangzhou, 中国
持續時間: 2013 六月 272013 六月 28

出版系列

名字Advanced Materials Research
787
ISSN(列印)1022-6680

其他

其他2013 2nd International Symposium on Materials Science and Engineering Technology, ISMSET 2013
國家/地區中国
城市Guangzhou
期間2013/06/272013/06/28

ASJC Scopus subject areas

  • 工程 (全部)

指紋

深入研究「Reading process of integrated circuit layout debugging: Evidence from eye movements」主題。共同形成了獨特的指紋。

引用此