Highly textured lead lanthanum titanate (Pb1-xLa x)TiO3 (PLT) thin films have been grown on fused quartz substrates by metalorganic chemical deposition (MOCVD). A series of PLT with different x between 0 and 0.32 were prepared and studied by Raman scattering. Raman spectra, measured at 300K and 80K, showed the features from the PLT film and quartz substrate. By using a "difference Raman" technique, more PLT modes are shown. The variations of the PLT Raman modes with the La composition and the measurement temperature are studied, and related physical phenomena and problems are discussed.
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