Probing the electronic structures of III-V-nitride semiconductors by x-ray photoelectron spectroscopy

T. S. Lay; W. T. Kuo; L. P. Chen; Y. H. Lai; W. H. Hung; J. S. Wang; J. Y. Chi; D. K. Shih; H. H. Lin

doi:10.1116/1.1735802

Probing the electronic structures of III-V-nitride semiconductors by x-ray photoelectron spectroscopy

T. S. Lay^*, W. T. Kuo, L. P. Chen, Y. H. Lai, W. H. Hung, J. S. Wang, J. Y. Chi, D. K. Shih, H. H. Lin

^*此作品的通信作者

研究成果: 雜誌貢獻 › 期刊論文 › 同行評審

16 引文斯高帕斯（Scopus）

原文	英語
頁（從 - 到）	1491-1494
頁數	4
期刊	Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures
卷	22
發行號	3
DOIs	https://doi.org/10.1116/1.1735802
出版狀態	已發佈 - 2004
對外發佈	是

ASJC Scopus subject areas

凝聚態物理學
電氣與電子工程

存取文件

10.1116/1.1735802

其它文件與鏈接

引用此

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title = "Probing the electronic structures of III-V-nitride semiconductors by x-ray photoelectron spectroscopy",

author = "Lay, {T. S.} and Kuo, {W. T.} and Chen, {L. P.} and Lai, {Y. H.} and Hung, {W. H.} and Wang, {J. S.} and Chi, {J. Y.} and Shih, {D. K.} and Lin, {H. H.}",

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T1 - Probing the electronic structures of III-V-nitride semiconductors by x-ray photoelectron spectroscopy

AU - Lay, T. S.

AU - Kuo, W. T.

AU - Chen, L. P.

AU - Lai, Y. H.

AU - Hung, W. H.

AU - Wang, J. S.

AU - Chi, J. Y.

AU - Shih, D. K.

AU - Lin, H. H.

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