Precision sinusoidal local scan for large-range atomic force microscopy with auxiliary optical microscopy

Chih Lieh Chen, Jim Wei Wu, Yi Ting Lin, Li Chen Fu, Mei Yung Chen

研究成果: 雜誌貢獻文章

21 引文 斯高帕斯(Scopus)

摘要

Atomic force microscopy (AFM) is a powerful measurement instrument which can build 3-D topography image of conductive and nonconductive samples at nanoscale resolution. However, due to the scan method of conventional AFM, the induced mechanical resonance of the scanner and the scan in area of uninterest would strictly limit the scan speed. In this study, we improve these problems with our designed AFM system from three aspects. First, the sinusoidal trajectory is applied to lateral scanning of the AFM rather than the traditional raster trajectory, so the scan rate can be increased without inducing vibration of the lateral scanner. Second, with this promising scan trajectory, the internal model principle-based neural network complementary sliding-mode controller and adaptive complementary sliding-mode controller are designed to achieve high precision scanning and to cope with the system parameter uncertainties and external disturbance. Finally, with the aid of an auxiliary optical microscopy and the scanned information during the scanning process, scan path planning can be adopted to focus the scanning on samples such that the total scan time is further shortened. Extensive experimental results are provided to show the appealing performance of the proposed method.

原文英語
文章編號6787105
頁(從 - 到)226-236
頁數11
期刊IEEE/ASME Transactions on Mechatronics
20
發行號1
DOIs
出版狀態已發佈 - 2015 二月

ASJC Scopus subject areas

  • Control and Systems Engineering
  • Computer Science Applications
  • Electrical and Electronic Engineering

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