摘要
Polarization-dependent X-ray absorption spectra (XAS) on the O 1s edge has been measured on a highly in-plane aligned (1 0 0) a-axis YBa2Cu3O7-δ (YBCO) thin films. The in-plane XAS, that is, the electric field E of the linearly polarized synchrotron light parallels to b- or c-axes of YBCO films (E∥b or E∥c), were obtained in a normal-incidence alignment. Furthermore, the XAS for E∥a was calculated from the oblique incidence to the sample with different angles. The present results are consistent with those obtained by using detwinned YBCO single crystals.
| 原文 | 英語 |
|---|---|
| 頁(從 - 到) | 435-436 |
| 頁數 | 2 |
| 期刊 | Physica C: Superconductivity and its Applications |
| 卷 | 388-389 |
| DOIs | |
| 出版狀態 | 已發佈 - 2003 5月 |
| 對外發佈 | 是 |
| 事件 | proceedings of the 23rd international conference on low temper - Hiroshima, 日本 持續時間: 2002 8月 20 → 2002 8月 27 |
ASJC Scopus subject areas
- 電子、光磁材料
- 凝聚態物理學
- 能源工程與電力技術
- 電氣與電子工程
指紋
深入研究「Polarization-dependent X-ray absorption spectroscopy of in-plane aligned (1 0 0) YBa2Cu3O 7-δ thin films」主題。共同形成了獨特的指紋。引用此
- APA
- Standard
- Harvard
- Vancouver
- Author
- BIBTEX
- RIS