Polarization-dependent optical responses of Sb-type near-field optical disk structure

Tai Chi Chu, Ming Yaw Ng, Kuo Pin Chiu, Wei-Chih Liu, Din Ping Tsai

研究成果: 書貢獻/報告類型會議貢獻

1 引文 斯高帕斯(Scopus)

摘要

The near-field and far-field optical properties of Sb-type near-field optical disk structures with different polarized situations are studied by finite-difference time-domain (FDTD) method. Localized surface plasmon enhancements are found around rough surface of Sb layers for TM polarized, but no near-field enhancement is found in cases with TE polarized incident waves. Far-field readout contrast signals of both TE and TM polarized situations show the super-resolution capability, because evanescent signals of subwavelength recording marks are coupled to propagating waves by nanostrucrures (nano aperture or rough surface) in near-field active layer. Nevertheless, the contrast signals for TM illumination are higher than TE illumination due to localized surface plasmon enhancements. A simplified Fourier optics model is used to describe the relation between highly localized near-field distributions and enhanced resolution of far-field signals.

原文英語
主出版物標題Plasmonics
主出版物子標題Nanoimaging, Nanofabrication, and their Applications II
DOIs
出版狀態已發佈 - 2006 十一月 21
事件Plasmonics: Nanoimaging, Nanofabrication, and their Applications II - San Diego, CA, 美国
持續時間: 2006 八月 162006 八月 17

出版系列

名字Proceedings of SPIE - The International Society for Optical Engineering
6324
ISSN(列印)0277-786X

其他

其他Plasmonics: Nanoimaging, Nanofabrication, and their Applications II
國家美国
城市San Diego, CA
期間06/8/1606/8/17

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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  • 引用此

    Chu, T. C., Ng, M. Y., Chiu, K. P., Liu, W-C., & Tsai, D. P. (2006). Polarization-dependent optical responses of Sb-type near-field optical disk structure. 於 Plasmonics: Nanoimaging, Nanofabrication, and their Applications II [632414] (Proceedings of SPIE - The International Society for Optical Engineering; 卷 6324). https://doi.org/10.1117/12.678992