Photocapacitive effect of ferroelectric hafnium-zirconate capacitor structure

Guan Lin Liou, Chun Hu Cheng, Yu Chien Chiu

研究成果: 書貢獻/報告類型會議論文篇章

摘要

In this work, we investigated the photocapacitive effect of the metal-ferroelectric-insulator-semiconductor capacitors under illumination. The photocapacitive effect is mainly caused by light photon excitation, contributed from the variation of depletion charge. We suggested that the ferroelectric domains are affected by defect dipole charges formed by the interface trapped charges to lead to the variation of depletion capacitance.

原文英語
主出版物標題EDSSC 2017 - 13th IEEE International Conference on Electron Devices and Solid-State Circuits
發行者Institute of Electrical and Electronics Engineers Inc.
頁面1-2
頁數2
ISBN(電子)9781538629079
DOIs
出版狀態已發佈 - 2017 十二月 1
事件13th IEEE International Conference on Electron Devices and Solid-State Circuits, EDSSC 2017 - Hsinchu, 臺灣
持續時間: 2017 十月 182017 十月 20

出版系列

名字EDSSC 2017 - 13th IEEE International Conference on Electron Devices and Solid-State Circuits
2017-January

會議

會議13th IEEE International Conference on Electron Devices and Solid-State Circuits, EDSSC 2017
國家/地區臺灣
城市Hsinchu
期間2017/10/182017/10/20

ASJC Scopus subject areas

  • 電子、光磁材料
  • 硬體和架構
  • 電氣與電子工程

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