Performance Evaluation of AFeRAM under Low Temperature Operation

Yi Chuan Chen; Yu Chen Chen; Kuo Yu Hsiang; Min Hung Lee; Pin Su

doi:10.1109/EDTM55494.2023.10103076

Performance Evaluation of AFeRAM under Low Temperature Operation

Yi Chuan Chen, Yu Chen Chen, Kuo Yu Hsiang, Min Hung Lee, Pin Su

光電工程學士學位學程

研究成果: 書貢獻/報告類型 › 會議論文篇章

1 引文斯高帕斯（Scopus）

摘要

In this work, we have evaluated performance of Antiferroelectric-RAM (AFeRAM) under low temperature operation. With our nucleation limited switching (NLS)-based AFE model calibrated with the AFE HZO (Hf0.1 Zr 0.9 O2) experimental data, we have investigated the AFeRAM cell operation from 80K to 300K. Our study indicates that operating AFeRAM at low temperatures may improve the sensing margin, read/write time, and energy efficiency.

原文	英語
主出版物標題	7th IEEE Electron Devices Technology and Manufacturing Conference
主出版物子標題	Strengthen the Global Semiconductor Research Collaboration After the Covid-19 Pandemic, EDTM 2023
發行者	Institute of Electrical and Electronics Engineers Inc.
ISBN（電子）	9798350332520
DOIs	https://doi.org/10.1109/EDTM55494.2023.10103076
出版狀態	已發佈 - 2023
事件	7th IEEE Electron Devices Technology and Manufacturing Conference, EDTM 2023 - Seoul, 大韓民國持續時間: 2023 3月 7 → 2023 3月 10

出版系列

名字	7th IEEE Electron Devices Technology and Manufacturing Conference: Strengthen the Global Semiconductor Research Collaboration After the Covid-19 Pandemic, EDTM 2023

會議

會議	7th IEEE Electron Devices Technology and Manufacturing Conference, EDTM 2023
國家/地區	大韓民國
城市	Seoul
期間	2023/03/07 → 2023/03/10

ASJC Scopus subject areas

安全、風險、可靠性和品質
電子、光磁材料
儀器
電氣與電子工程

UN SDG

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10.1109/EDTM55494.2023.10103076

其它文件與鏈接

引用此

Chen, Y. C., Chen, Y. C., Hsiang, K. Y., Lee, M. H., & Su, P. (2023). Performance Evaluation of AFeRAM under Low Temperature Operation. 於 7th IEEE Electron Devices Technology and Manufacturing Conference: Strengthen the Global Semiconductor Research Collaboration After the Covid-19 Pandemic, EDTM 2023 (7th IEEE Electron Devices Technology and Manufacturing Conference: Strengthen the Global Semiconductor Research Collaboration After the Covid-19 Pandemic, EDTM 2023). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/EDTM55494.2023.10103076

Performance Evaluation of AFeRAM under Low Temperature Operation. / Chen, Yi Chuan; Chen, Yu Chen; Hsiang, Kuo Yu 等.
7th IEEE Electron Devices Technology and Manufacturing Conference: Strengthen the Global Semiconductor Research Collaboration After the Covid-19 Pandemic, EDTM 2023. Institute of Electrical and Electronics Engineers Inc., 2023. (7th IEEE Electron Devices Technology and Manufacturing Conference: Strengthen the Global Semiconductor Research Collaboration After the Covid-19 Pandemic, EDTM 2023).

研究成果: 書貢獻/報告類型 › 會議論文篇章

Chen, YC, Chen, YC, Hsiang, KY, Lee, MH & Su, P 2023, Performance Evaluation of AFeRAM under Low Temperature Operation. 於 7th IEEE Electron Devices Technology and Manufacturing Conference: Strengthen the Global Semiconductor Research Collaboration After the Covid-19 Pandemic, EDTM 2023. 7th IEEE Electron Devices Technology and Manufacturing Conference: Strengthen the Global Semiconductor Research Collaboration After the Covid-19 Pandemic, EDTM 2023, Institute of Electrical and Electronics Engineers Inc., 7th IEEE Electron Devices Technology and Manufacturing Conference, EDTM 2023, Seoul, 大韓民國, 2023/03/07. https://doi.org/10.1109/EDTM55494.2023.10103076

Chen YC, Chen YC, Hsiang KY, Lee MH, Su P. Performance Evaluation of AFeRAM under Low Temperature Operation. 於 7th IEEE Electron Devices Technology and Manufacturing Conference: Strengthen the Global Semiconductor Research Collaboration After the Covid-19 Pandemic, EDTM 2023. Institute of Electrical and Electronics Engineers Inc. 2023. (7th IEEE Electron Devices Technology and Manufacturing Conference: Strengthen the Global Semiconductor Research Collaboration After the Covid-19 Pandemic, EDTM 2023). doi: 10.1109/EDTM55494.2023.10103076

Chen, Yi Chuan ; Chen, Yu Chen ; Hsiang, Kuo Yu 等. / Performance Evaluation of AFeRAM under Low Temperature Operation. 7th IEEE Electron Devices Technology and Manufacturing Conference: Strengthen the Global Semiconductor Research Collaboration After the Covid-19 Pandemic, EDTM 2023. Institute of Electrical and Electronics Engineers Inc., 2023. (7th IEEE Electron Devices Technology and Manufacturing Conference: Strengthen the Global Semiconductor Research Collaboration After the Covid-19 Pandemic, EDTM 2023).

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AB - In this work, we have evaluated performance of Antiferroelectric-RAM (AFeRAM) under low temperature operation. With our nucleation limited switching (NLS)-based AFE model calibrated with the AFE HZO (Hf0.1 Zr 0.9 O2) experimental data, we have investigated the AFeRAM cell operation from 80K to 300K. Our study indicates that operating AFeRAM at low temperatures may improve the sensing margin, read/write time, and energy efficiency.

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Performance Evaluation of AFeRAM under Low Temperature Operation

摘要

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ASJC Scopus subject areas

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