P-103: Redistributed deep states created by mechanical bending to improve the electrical reliability of a-Si:H TFTs on flexible substrates

M. H. Lee*, S. H. Lu, S. T. Chang, M. Tang, J. J. Huang, K. Y. Ho, Y. S. Huang, C. C. Lee

*此作品的通信作者

研究成果: 書貢獻/報告類型 › 會議論文篇章

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INIS

Engineering

Material Science