Optical properties of Si-doped GaN films

H. C. Yang, T. Y. Lin, M. Y. Huang, Y. F. Chen

研究成果: 雜誌貢獻期刊論文同行評審

20 引文 斯高帕斯(Scopus)

摘要

Results of the front-side and back-side photoluminescence (PL) measurements in a set of Si-doped GaN epifilms are presented. From the back-side PL spectrum, the enhancement of the yellow emission implies that most of the intrinsic defects responsible for the yellow band exist mainly near the interface between the buffer layer and the epilayer. We also found that the intensity of the yellow luminescence decreases with increasing Si dopants, which is consistent with the fact that the microscopic origin of the yellow emission can be attributed to gallium vacancies VGa. In additions, our investigations reveal that the potential fluctuations, that give rise to the effect of band-gap narrowing and linewidth broadening, are mainly caused by randomly distributed doping impurities instead of other defects.

原文英語
頁(從 - 到)6124-6127
頁數4
期刊Journal of Applied Physics
86
發行號11
DOIs
出版狀態已發佈 - 1999 十二月

ASJC Scopus subject areas

  • Physics and Astronomy(all)

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