摘要
InSb films were grown on GaAs substrates by low-pressure metalorganic chemical vapor deposition (LPMOCVD). Far-infrared (FIR) reflectance spectroscopy and Raman scattering has been used to study the lattice vibration behavior of these samples and the effects of III-V source ratios on the films crystalline quality to optimize the growth parameters. Lattice vibration modes were characterized. Film thickness, composition, stoichiometry and depth profiles were studied. The carrier concentration, mobility, effective mass as well as the dielectric behavior of these films are fitted by a model of dielectric response.
| 原文 | 英語 |
|---|---|
| 頁(從 - 到) | 1189-1190 |
| 頁數 | 2 |
| 期刊 | Physica B: Condensed Matter |
| 卷 | 284-288 |
| 發行號 | PART II |
| DOIs | |
| 出版狀態 | 已發佈 - 2000 |
ASJC Scopus subject areas
- 電子、光磁材料
- 凝聚態物理學
- 電氣與電子工程
指紋
深入研究「Optical characterization and transport behaviors of LPMOCVD-grown InSb epitaxial films」主題。共同形成了獨特的指紋。引用此
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