Current-voltage (I-V) characteristics of step-edge YBa2Cu3Oy junctions on MgO(001) substrates were measured over various temperature and frequency ranges to examine the effects of microwave irradiation and magnetic fields on the I-V behaviors of the junctions. In addition to the usual integer Shapiro steps, half-integer Shapiro steps were observed under microwave irradiation. Both the integer and half-Integer Shapiro steps were sensitive to the applied magnetic field and the microwave power. The results are discussed.
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