摘要
The fusion of volatile and nonvolatile memory within a complementary-dynamic random-access memory (C-DRAM) in one cell is proposed with antiferroelectric-like hafnium-zirconium oxide with dual function characteristics of DRAM and storage class memory in the memory hierarchy. Atomic-resolution spherical aberration-corrected scanning transmission electron microscopy is employed to directly reveal the insights of phase evolution by utilizing diffractograms to determine lattice parameters. Storage-data-transfer-cycling-recovery with an alternating access scheme is introduced due to the characteristic of independent domains to exhibit multilevel states. Remanent polarization (Pr) can be restored, and 34 periods (3 × 1010 cycles/period) to accumulate 1.02 × 1012 switching cycles are demonstrated. The proposed method is effective in prolonging the endurance and evaluating the spatially resolved evolution of polarization.
| 原文 | 英語 |
|---|---|
| 頁(從 - 到) | 14342-14349 |
| 頁數 | 8 |
| 期刊 | ACS Applied Materials and Interfaces |
| 卷 | 17 |
| 發行號 | 9 |
| DOIs | |
| 出版狀態 | 已發佈 - 2025 3月 5 |
| 對外發佈 | 是 |
ASJC Scopus subject areas
- 一般材料科學
指紋
深入研究「Nonvolatile and Volatile Memory Fusion of Antiferroelectric-like Hafnium-Zirconium Oxide for Multi-Bit Access and Endurance >1012 Cycles by Alternating Polarity Cycling Recovery and Spatially Resolved Evolution」主題。共同形成了獨特的指紋。引用此
- APA
- Standard
- Harvard
- Vancouver
- Author
- BIBTEX
- RIS