Noncontact electrical test of a ball grid array substrate that uses the electro-optic probing technique

Wen Kai Kuo; Deng Tzung Tang; Chien Jang Wu; Thomson Lai

doi:10.1364/AO.44.004205

Noncontact electrical test of a ball grid array substrate that uses the electro-optic probing technique

Wen Kai Kuo^*
, Deng Tzung Tang
, Chien Jang Wu
, Thomson Lai

^*此作品的通信作者

研究成果: 雜誌貢獻 › 期刊論文 › 同行評審

2 引文斯高帕斯（Scopus）

摘要

A new technique for testing a ball grid array (BGA) package substrate that uses the electro-optic (EO) probing technique is investigated. This technique can detect open circuits in the BGA substrate with a high spatial resolution. An experimental setup that uses an EO probe tip made of LiNbO₃ crystal is reported along with the measurement results from a real BGA substrate.

原文	英語
頁（從 - 到）	4205-4210
頁數	6
期刊	Applied Optics
卷	44
發行號	20
DOIs	https://doi.org/10.1364/AO.44.004205
出版狀態	已發佈 - 2005 7月 10
對外發佈	是

ASJC Scopus subject areas

原子與分子物理與光學
工程（雜項）
電氣與電子工程

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10.1364/AO.44.004205

其它文件與鏈接

Link to publication in Scopus

引用此

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abstract = "A new technique for testing a ball grid array (BGA) package substrate that uses the electro-optic (EO) probing technique is investigated. This technique can detect open circuits in the BGA substrate with a high spatial resolution. An experimental setup that uses an EO probe tip made of LiNbO3 crystal is reported along with the measurement results from a real BGA substrate.",

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AB - A new technique for testing a ball grid array (BGA) package substrate that uses the electro-optic (EO) probing technique is investigated. This technique can detect open circuits in the BGA substrate with a high spatial resolution. An experimental setup that uses an EO probe tip made of LiNbO3 crystal is reported along with the measurement results from a real BGA substrate.

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Noncontact electrical test of a ball grid array substrate that uses the electro-optic probing technique

摘要

ASJC Scopus subject areas

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其它文件與鏈接

指紋

引用此