Non-contact bias voltage measurement using the electro-optic probing technique

Wen Kai Kuo*, Jen Yu Kuo, Chien Jang Wu, Fuh Shyang Juang


研究成果: 雜誌貢獻期刊論文同行評審

2 引文 斯高帕斯(Scopus)


The traditional non-contact electro-optic (EO) probing technique is further extended to measure quasi-dc bias voltages. We propose a special external LiTaO3 probe equipped with a grounded side-electrode (GSE) and a power supply modulation (PSM) method. The GSE can improve the voltage measurement sensitivity and error due to the tip position variation. The PSM can make all bias voltages chopped and readily picked up by using a high sensitivity lock-in amplifier. Test results on model circuits demonstrated that the proposed new EO probing system can obtain voltage measurement results that are in good agreement with known values. With this extension function this new system can perform ac high frequency and dc bias voltage measurements as well.

期刊Measurement Science and Technology
出版狀態已發佈 - 2008 8月 1

ASJC Scopus subject areas

  • 儀器
  • 工程(雜項)
  • 應用數學


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