TY - JOUR
T1 - Multilabel Deep Visual-Semantic Embedding
AU - Yeh, Mei Chen
AU - Li, Yi Nan
N1 - Publisher Copyright:
© 1979-2012 IEEE.
PY - 2020/6/1
Y1 - 2020/6/1
N2 - Inspired by the great success from deep convolutional neural networks (CNNs) for single-label visual-semantic embedding, we exploit extending these models for multilabel images. We propose a new learning paradigm for multilabel image classification, in which labels are ranked according to its relevance to the input image. In contrast to conventional CNN models that learn a latent vector representation (i.e., the image embedding vector), the developed visual model learns a mapping (i.e., a transformation matrix) from an image in an attempt to differentiate between its relevant and irrelevant labels. Despite the conceptual simplicity of our approach, the proposed model achieves state-of-the-art results on three public benchmark datasets.
AB - Inspired by the great success from deep convolutional neural networks (CNNs) for single-label visual-semantic embedding, we exploit extending these models for multilabel images. We propose a new learning paradigm for multilabel image classification, in which labels are ranked according to its relevance to the input image. In contrast to conventional CNN models that learn a latent vector representation (i.e., the image embedding vector), the developed visual model learns a mapping (i.e., a transformation matrix) from an image in an attempt to differentiate between its relevant and irrelevant labels. Despite the conceptual simplicity of our approach, the proposed model achieves state-of-the-art results on three public benchmark datasets.
KW - Multilabel classification
KW - convolutional neural networks
KW - visual semantic embedding
UR - http://www.scopus.com/inward/record.url?scp=85084720672&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=85084720672&partnerID=8YFLogxK
U2 - 10.1109/TPAMI.2019.2911065
DO - 10.1109/TPAMI.2019.2911065
M3 - Article
C2 - 30990418
AN - SCOPUS:85084720672
SN - 0162-8828
VL - 42
SP - 1530
EP - 1536
JO - IEEE Transactions on Pattern Analysis and Machine Intelligence
JF - IEEE Transactions on Pattern Analysis and Machine Intelligence
IS - 6
M1 - 8691414
ER -