Modeling and correlation of gate oxide QBD between exponential current ramp and constant current stresses

Chuan H. Liu*, Tun Jen Cheng, Mu Chun Wang, S. H. Yang, K. Y. Fu

*此作品的通信作者

研究成果: 雜誌貢獻會議論文同行評審

1 引文 斯高帕斯(Scopus)

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Physics & Astronomy

Chemical Compounds

Engineering & Materials Science