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Mitigating Overfitting in Fine-Pattern Quality Classification: Enabling Automated Projection Image Quality Inspection

  • Chih Yao Hu
  • , Po Yung Chou
  • , Cheng Hung Lin*
  • , Kuan Yen Kuo
  • , You Min Chen
  • , Wen Chun Wang
  • *此作品的通信作者

研究成果: 書貢獻/報告類型會議論文篇章

摘要

This paper presents a deep learning-based method for automated projection image quality inspection. Traditional inspection relies on manual visual evaluation, which is timeconsuming, labor-intensive, and inconsistencies due to subjective judgment and operator fatigue. Mainstream object detection models such as the YOLO series are not suited for this task due to their low accuracy on small objects and the requirement to resize high-resolution images an approach typically adopted to reduce computational load and inference time given the complexity of these models which ultimately compromises the quality of fine-pattern features. To overcome these limitations, we propose a two-stage inference framework that integrates template-based object detection with a ResNet classification network. In the first stage, template matching is employed to detect 1,458 fine-patterns from high-resolution projection images. In the second stage, each fine-pattern is classified into one of ten image quality levels using a ResNet50-based model. A key contribution of this work is the introduction of a quality-preserving data augmentation strategy that effectively mitigates overfitting without compromising fine-pattern quality. This approach improves the model's robustness to positional deviations commonly observed in corner fine-patterns of projection images. Experimental results demonstrate that the proposed method achieves high classification accuracy across various geometric conditions and significantly outperforms the baseline in challenging corner regions. Furthermore, the system provides visual feedback through color-coded bounding boxes overlaid on the projection image, enabling intuitive interpretation of spatial image quality. The proposed method offers a practical solution for improving the efficiency and reliability of quality inspection in real-world projection images.

原文英語
主出版物標題IEEE RASSE 2025 - IEEE International Conference on Recent Advances in Systems Science and Engineering, Proceedings
發行者Institute of Electrical and Electronics Engineers Inc.
ISBN(電子)9798331544355
DOIs
出版狀態已發佈 - 2025
事件2025 International Conference on Recent Advances in Systems Science and Engineering, RASSE 2025 - Singapore, 新加坡
持續時間: 2025 11月 42025 11月 7

出版系列

名字IEEE RASSE 2025 - IEEE International Conference on Recent Advances in Systems Science and Engineering, Proceedings

會議

會議2025 International Conference on Recent Advances in Systems Science and Engineering, RASSE 2025
國家/地區新加坡
城市Singapore
期間2025/11/042025/11/07

ASJC Scopus subject areas

  • 能源工程與電力技術
  • 控制與系統工程
  • 控制和優化
  • 人工智慧
  • 電腦視覺和模式識別
  • 人機介面

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