Microscopic interfacial structures and magnetic properties of ultrathin CoSi(111) films

J. S. Tsay*, T. Y. Fu, M. H. Lin, C. S. Yang, Y. D. Yao

*此作品的通信作者

研究成果: 雜誌貢獻期刊論文同行評審

44 引文 斯高帕斯(Scopus)

摘要

The relation between magnetic properties and microscopic structure for a metal/semiconductor system is described. Cobalt films on a CoSi interface possess an in-plane easy axis of magnetization as the result of magnetocrystalline anisotropy of the CoCoSi interface. On a Si(111)-7×7 surface, direct evidence for the formation of CoSi2 compounds at the interface was found by the appearance of doubled spot defects in scanning tunneling microscopic images. The interfacial effects cause the easy axis of magnetization of a CoSi interface to be canted out of plane.

原文英語
文章編號102506
期刊Applied Physics Letters
88
發行號10
DOIs
出版狀態已發佈 - 2006

ASJC Scopus subject areas

  • 物理與天文學(雜項)

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