摘要
In this study, direct observation of the evolution of electronic structures across complex oxide interfaces has been revealed in the LaAlO 3/SrTiO3 model system using cross-sectional scanning tunneling microscopy and spectroscopy. The conduction and valence band structures across the LaAlO3/SrTiO3 interface are spatially resolved at the atomic level by measuring the local density of states. This study directly maps out the electronic reconstructions and a built-in electric field in the polar LaAlO3 layer. Results also clearly reveal the band bending and the notched band structure in the SrTiO3 adjacent to the interface.
| 原文 | 英語 |
|---|---|
| 文章編號 | 246807 |
| 期刊 | Physical Review Letters |
| 卷 | 109 |
| 發行號 | 24 |
| DOIs | |
| 出版狀態 | 已發佈 - 2012 12月 12 |
| 對外發佈 | 是 |
ASJC Scopus subject areas
- 一般物理與天文學
指紋
深入研究「Mapping band alignment across complex oxide heterointerfaces」主題。共同形成了獨特的指紋。引用此
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